Video Microscope
A video optical microscope in an AFM serves two functions: first, it is used for aligning the laser onto the cantilever in the light lever AFM; secondly, the optical microscope is useful for locating surface features for scanning. Included with the TT-AFM is a high-performance video optical microscope. Included with the microscope are a 3 megapixel CCD camera, light source, microscope stand and Windows software for displaying images.
Scanning Modes
Standard with every TT-AFM are non-vibrating (NV) and vibrating (V) modes for making topography scans. Additional modes included with the product are lateral force imaging as well as phase mode imaging. Further, all of the scanning modes that can be implemented with a light lever AFM are possible with the TT-AFM.
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| With the window at the right the resonance frequency of a cantilever is readily measured. Thus, vibrating-mode AFM images are readily measured. Additionally, the phase characteristics of the probe sample interaction may be captured. |
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Open Design
An open design is at the core of all products offered by the AFM Workshop. For example, with LabView software, new types of experiments can be readily designed and implemented. All of the mechanical drawings for the TT-AFM are available in the documentation package option (more information). Finally, the company's website offers a users' forum for directly sharing specialized designs developed for the TT-AFM. For specialized applications, other types of scanners such as flexure and tubes can be easily added to the microscope stage.
Options
Although the TT-AFM comes with everything that you need to make AFM images, there are some options available. For example, an anti-vibration platform. (Of course, if you already own these items, as many labs do, there is no need to purchase them.) The TT-AFM is a dynamic product, and new options will be made available as they are developed by the AFM Workshop or its customers.
| Specifications |
|
| Xyz
Scanner |
|
| Type |
Modified tripod |
| X-Y linearity |
< 1% |
| X-Y range |
>50 μ |
| X-Y resolution |
< 1 nm open loop, <10 nm closed loop |
| Actuator type |
Piezo |
| Sensor type |
Strain gauge |
| Z range |
> 16 μ |
| Z linearity |
< 5% |
| Z sensor noise |
< 10 nm |
| Z feedback noise |
< 0.1 nm* |
| Actuator type |
Piezo |
| Sensor type |
Strain gauge |
|
| Sample Holder |
|
| Type |
Modified tripod |
| Max. lateral dimensions |
20 mm |
| Max. height |
5 mm |
|
| Light Lever AFM Force Sensor |
|
| Probe types |
Industry standard |
| Probe insertion |
Manual, with special tool |
| Probe holding mechanism |
Clip |
| Adjustment range |
3 mm |
| Adjustment resolution; |
1 micron |
| Minimum probe to objective |
25 mm; |
| Laser type |
635-670 nm diode, < 5 mw |
| Detector |
|
| Type |
4 quadrant |
| Band width |
> 5 Khz |
| Signals transmitted |
TL, BL, TR, BR |
| Gain |
Lo, high settings |
|
| |
|
|
| X-Y
Translator |
|
| Range |
25 mm |
| Resolution |
25 μ |
| Type |
Bearing Spring loaded |
| Lock Down |
Yes |
|
| Z Motion |
|
| Type |
Direct Drive |
| Range |
25 mm |
| Drive type |
Stepper motor |
| Min. step size |
330 nm |
| Slew rate |
1 mm/sec |
| Limit Switch |
Top, bottom |
|
| Digital Data Input Output |
|
| Connection |
USB |
| Scanning DAC |
|
| Number |
2 |
| Bits |
24 |
| Frequency |
7 KZ |
|
| Control DAC |
| Number |
2 |
| Bits |
14 |
| Frequency |
4 Kz |
|
| ADC |
|
| Number |
8 |
| Bits |
14 |
| Frequency |
48 KHz |
|
|
| Analog Electronics |
|
| Vibrating |
|
| Freq range |
2 KHz - 800 KHz |
| Output Voltage |
10 Vpp |
| Demod. freq |
TBD |
|
| Z Feedback |
|
| Type |
PID |
| Bandwidth |
> 3 KHz |
| Sample Hold |
Yes |
| Voltage |
0 - 150 V |
|
| X - Y Scan |
|
| Voltage |
0 -150 V |
| Bandwidth |
> 200 Hz |
| Pan & Zoom |
24 Bits |
|
| Tip Approach Cutoff |
> 20 μ sec. |
|
| Software |
|
| Environment |
LabView |
| Image acquisition |
Real time display (2 of 8 channels) |
| Control parameters |
|
| PID |
Yes |
| Setpoint |
Yes |
| Range |
Yes |
| Scan Rate |
Yes |
|
| Laser align |
Yes |
| Vibrating freq. display |
Yes |
| Force distance |
Yes (release 1.5) |
| Tip approach |
Yes |
| Oscilloscope |
Yes |
| Image store format |
Industry standard |
| Image pixels |
16 x 16 to 1024 x 1024 |
|
Video Microscope
|
Minimum Zoom
|
Maximum Zoom
|
| Field
of view
|
2 X 2 mm
|
300 X 300 u
|
| Resolution
|
20 u
|
2 u
|
| Working
distance
|
114 mm
|
114 mm
|
| Magnification
|
45 X
|
400 X
|
|
Computer: Industry-standard computer
*Z Noise performance depends
greatly on the environment the TT-AFM is used in. Best Z noise performance is
obtained in a vibration-free environment.
** Every effort is made to present accurate specifications, however, due to circumstances out of the AFMWorksop's control specifications are subject to change. |
